Fraunhofer IISB and Park Systems are announcing the call for abstracts as well as opening registration for the 2nd International Symposium on Failure Analysis and Material Testing – FAMT 2022.  This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future.    The event is going to be held in a hybrid form:  ON-SITE VENUE: Fraunhofer IISB, Schottkystrasse 10, Erlangen, Germany VIRTUAL PLATFORM: Zoom   he design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international…

Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range. Are you experiencing similar challenges in your daily work? Join us on July 1, 2021! This symposium gathers the professionals from the electronic industry to discuss innovative testing methods and tools for failure analysis of the future. The program will include keynote talks ranging from case studies in the…